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JEOL X-RAY FLUROSCENCE SPECTROMETER

MODEL JSX-1000S Element Eye^TM
XRF Spectrometer

The Smart Solution for Elemental Analysis

Simple Operation

» Simply set the sample and touch the screen, that’s how easy it is to operate.

High Sensitivity

» High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit.

High Precision Quantitative Analysis

» The new Smart FP (Fundamental Parameter) method makes it possible to obtain highly-accurate quantitative results without the need to prepare a standard sample.

High Throughput

» The new high-sensitivity SDD (silicon drift detector) and short-path optical system achieve throughputs up to 7.6 times faster.

Standard Solution

» RoHs analysis (Metals)

» Simple analysis (Metals: Air / Vacuum*)

» Simple analysis (Organic materials: Air / Vacuum*)

» Simple analysis (Oxides: Air / Vacuum*) (*option)

Optional Solution

» Ni plating screening

» Sn plating screening

» Halogen screening